Protecting test port of embedded systems to keep data safe
نویسنده
چکیده
Security is a growing concern for embedded system designers. Therefore a wide range of protection mechanisms have been developed in the recent years to counter malicious attacks. This work gives an overview and compares existing solutions concerning the protection of the test access port. Potential improvements are then proposed over some of the previous works. Keywords—security, JTAG, IEEE 1687, DfT, test access port
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